1994-01 GARRIGOUX, Christian and William Q. MEEKER
Assessing the Effect of In-Service Inspections on the Reliability of Degrading Components
(abstract pdf)
(Paper Unavailable)
1994-02 ESCOBAR, Luis and William Q. MEEKER
The Asymptotic Covariance Matrix for Maximum Likelihood Estimators with Models Based on Location-Scale Distributions Involving Censoring, Truncation, and Explanatory Variables
(abstract pdf)
(Paper Unavailable)
1994-24 MARASINGHE, Mervyn, William MEEKER, Dianne COOK and Tae-sung SHIN
Using Graphics and Simulation to Teach Statistical Concepts
(abstract pdf)
(Paper Unavailable)
1994-33 CANNON, Ann R. and William Q. MEEKER
Statistical Tests for Signals in Categorical Temporal Data
(abstract pdf)
(Paper Unavailable)
1995-07 MEEKER, William Q. and Michael HAMADA
Statistical Tools for the Rapid Development and Evaluation of High-Reliability Products
(abstract pdf)
(paper pdf)
(paper ps)
1995-08 MEEKER, William Q.
Graphical Tools for Exploring and Analyzing Data from ARIMA Time Series Models
(abstract pdf)
(paper pdf)
(paper ps)
1995-41 PASCUAL, F. G. and William Q. MEEKER
Regression Analysis of Fatigue Data with Right Censoring Based on a Model with Nonconstant Variance and a Fatigue Limit Parameter
(abstract pdf)
(paper pdf)
(paper ps)
1996-26 MEEKER, William Q., Luis A. ESCOBAR and C. Joseph LU
Accelerated Degradation Tests: Modeling and Analysis
(abstract html)
(paper pdf)
(paper ps)
1997-01 SARKAR, Pradipta and William Q. MEEKER
A. Bayesian On-Line Change Detection Algorithm With Process Monitoring Applications
(abstract html)
(paper pdf)
(paper ps)
1997-18 PASCUAL, Francis G. and William Q. MEEKER
Estimating Fatigue Curves with the Random Fatigue-Limit Model
(abstract html)
(paper pdf)
(paper ps)
1997-19 PASCUAL, Francis G. and William Q. MEEKER
The Modified Sudden Death Test: Planning Life Tests with a Limited Number of Test Positions
(abstract html)
(paper pdf)
(paper ps)
1997-27 ESCOBAR, Luis A. and William Q. MEEKER
Statistical Prediction Based on Censored Life Data
(abstract html)
(paper pdf)
(paper ps)
1997-39 JENG, Shuen-Lin and William Q. MEEKER
Comparisons of Weibull Distribution Approximate Confidence Intervals Procedures for Type I Censored Data
(abstract html)
(paper pdf)
(paper ps)
2000-03 ESCOBAR, Luis A. and William Q. MEEKER
The Asymptotic Equivalence of the Fisher Information Matrices for Type I and Type II Censored Data from Location-Scale Families
(abstract html)
(paper pdf)
(paper ps)
2000-04 JENG, Shuen-Lin and William Q. MEEKER
Simultaneous Parametric Confidence Bands for Cumulative Distributions from Censored Data
(abstract html)
(paper pdf)
(paper ps)
2000-09 NORDMAN, Daniel and William Q. MEEKER
Weibull Prediction Intervals for a Future Number of Failures
(abstract html)
(paper pdf)
(paper ps)
2000-12 MEEKER, William Q., Luis A. ESCOBAR and Victor CHAN
Using Accelerated Tests to Predict Service Life in Highly-Variable Environments
(abstract html)
(paper pdf)
(paper ps)
2001-06 WU, Huaiqing and William Q. MEEKER
Early Detection of Reliability Problems Using Information Warranty Databases
(abstract html)
(paper pdf)
2001-07 MEEKER, William Q., Luis A. ESCOBAR and Steve A. ZAYAC
Use of Sensitivity Analysis to Assess the Effect of Model Uncertainty in Analyzing Accelerated Life Test Data
(abstract html)
(paper pdf)
2001-08 CHAN, Victor and William Q. MEEKER
Estimation of Degradation-Based Reliability in Outdoor Environments
(abstract html)
(paper pdf)
2001-09 MEEKER, William Q. and Luis A. ESCOBAR
Software for Reliability Data Analysis and Test Planning
(abstract html)
(paper pdf)
2001-10 MEEKER, William Q. and Luis ESCOBAR
Use of Truncated Regression Methods to Estimate the Shelf Life of a Product from Incomplete Historical Data
(abstract html)
(paper pdf)
2002-02 MCKANE, Scott W., Luis ESCOBAR and William Q. MEEKER
Sample Size and Number of Failure Requirements for Demonstration Tests with Log-Location-Scale Distributions and Type II Censoring
(abstract pdf)
(paper pdf)
2002-03 ZHANG, Yao and William Q. MEEKER
Bayesian Life Test Planning for the Weibull Distributions with Given Shape Parameter
(abstract pdf)
(paper pdf)
2003-01 ESCOBAR, Luis A., William Q. MEEKER, Danny L. KUGLER and Laura L. KRAMER
Accelerated Destructive Degradation Tests: Data, Models and Analysis
(abstract pdf)
(paper pdf)
2003-04 JENG, Shuen-Lin, S.N. LAHIRI and William Q. MEEKER
Asymptotic Properties of Bootstrap Likelihood Ratio Statistics for Time Censored Data
(abstract pdf)
(paper pdf)
2003-12 CHAN, Victor, Soumendra N. LAHIRI and William Q. MEEKER
Block Bootstrap Estimation of the Distribution of Cumulative Outdoor Degradation
(abstract pdf)
(paper pdf)
2003-13 ZHANG, Yao and William Q. MEEKER
Bayesian Optimum Planning For Accelerated Tests
(abstract pdf)
(paper pdf)
2003-14 MEEKER, William Q. and Luis ESCOBAR
Reliability: The Other Dimension of Quality
(abstract pdf)
(paper pdf)
2005-04 ZUO, Jianying, William MEEKER and Huaiqing WU
Analysis of Window-Observation Recurrence Data
(abstract pdf)
(paper pdf)
2006-05 HONG, Yili, William MEEKER and Luis Q.ESCOBAR
Normal Approximations for Computing Confidence Intervals for Log-Location-Scale Distribution Probabilities
(abstract pdf)
(paper pdf)
2006-06 MEEKER, William Q. and Luis ESCOBAR
A Review of Accelerated Test Models
(abstract pdf)
(paper pdf)
2008-02 HONG, Yili, William Q. MEEKER and Luis A. ESCOBAR
The Relationship between Confidence Intervals for Failure Probabilities and Life Time Quantiles
(abstract pdf)
(paper pdf)
2008-03 ESCOBAR, Luis A., Yili HONG and William Q. MEEKER
Simultaneous Confidence Bands and Regions for Log-Location-Scale Distributions with Censored Data
(abstract pdf)
(paper pdf)
2008-04 SHI, Ying, Luis ESCOBAR and William Q. MEEKER
Accelerated Destructive Degradation Test Planning
(abstract pdf)
(paper pdf)